Projekt
AtomDensityMap: Simulationsbasierte Punktdefektanalyse
Ptychography, DFT modelling, Machine Learning, Point Defect Characterization, Van-Der-Waals Materials, 4D-STEM, Naturwissenschaften, Informatik, Physik, Astronomie, Computersimulation, Machine Learning, Materialphysik, Elektronenmikroskopie
Ptychography, DFT modelling, Machine Learning, Point Defect Characterization, Van-Der-Waals Materials, 4D-STEM, Naturwissenschaften, Informatik, Physik, Astronomie, Computersimulation, Machine Learning, Materialphysik, Elektronenmikroskopie